1060/G-CX-3.0NE-AU-3.0 C | PTR

Threaded spring contact with probe, waffle, Ø 2.65 mm, travel  5.5 mm, pitch 4 mm, L 27.5 mm, 1060/G-CX-3.0NE-AU-3.0 C

Order No.: 12H2320
EAN: 4099889469141
MPN:
1060/G-CX-3.0NE-AU-3.0 C
610600671251
Series: 1060/G
1060/G-CX-3.0NE-AU-3.0 C PTR Contact Probes
Image may differ
Unit Price (€ / pc.)
10.8885 € *
Available: 14 pcs.
Total Price:
10.89 € *
Price list
Quantity
Price per unit*
1 pcs.
10.8885 €
10 pcs.
9.6152 €
100 pcs.
8.3657 €
250 pcs.
7.7231 €
1000 pcs.
7.1162 €
*incl. VAT plus shipping costs
Subject to prior sale

High-current threaded spring force contacts, type PTR 10.

Design A: concave 90°. For connector pins, wire-wrap posts and straight / bent terminals. To be used on clean PCB because of the risk of contamination. W: pointed tip 30°, for PCB traces, through-plating, solder joints, and test pads. Design BS: practical flexible needle, point-of use reliable penetration of flux and coiling on unwashed PCBs or modules, or for contacting SMD. Design BST: sharp steel needle with endurance for reliable penetration of flux and dirt on uncleaned PCBs or modules and for SMD contacts. Design C: serrated, A universal head for straight or curved hookup wires, wire-wrap posts and connector pins. Design CS: serrated, with overlapping plastic insulation, presence test of component connections. The overlapping plastic insulation prevents electrical contact in places where the connection is missing. Design D: round head, for contacting PCB traces and contact surfaces. The round tip does not leave marks on the contact surface. Also used to contact socket contacts in connectors. Design E: convex, for clean vias or connector sockets. Design F: flat tip, used on tabs and clean convex contact surfaces to avoid damage to the surface. Design G: four-point crown, for hookup wires, solder joints and test pads without heavy contamination. Design H: pyramid, contact to plated through-holes without problems, also suitable for use on objects with flux residue. Design K: hexagonal, similar to H, but more aggressive and with higher contact reliability. Also used with rotary spring force contacts, cuts through oxide layers and dirt. Design M: crown, with overlapping center tip. The crown and central tip combination ensures reliable contact at almost any test point. The overlapping center tip fixes the probe tip. Design Q: 4-point crown, self-cleaning, for contacting on heavily soiled PCBs. The special cut of the tip discharges dirt to the outside.

High-current probes with tip series 1060/G.

Grid: 4.0 mm. Maximum travel: 5.5 mm. Working travel: 4.4 mm. Working travel spring force (±20 %): 3.0 N. Spring prestress: 0.8 N. Rated current: 24 A. Contact resistance: typically 10 mohm. Barrel: gold-plated brass. Spring: gold-plated spring steel.

Technical attributes (type, tip shape, tip diameter, plunger material): 1060/G-CX-3,0 N-Au-3,0C, CX, D 3.0 mm, gold-plated CuBe.

Technical specifications
Filter Property Value
Head shape waffle
Rated current 24 A
Stroke 5.5 mm
Grid 4 mm
Length 27.5 mm
diameter 2.65 mm
Material brass
Logistics
Property Value
Customs tariff number 85369095
Country of origin DE
Compliance
Property Value
SVHC free Yes
RoHS conform Yes
Date of RoHS guidelines 3/31/15