Sleeve for test probe, soldered connection, H 2021 L

ICT spring contact with probe, waffle, Ø 1.65 mm, travel  5.3 mm, pitch 2.54 mm, L 32.3 mm, 2021-C-2.25N-AU-2.0

ICT spring contact with probe, round head, Ø 1.65 mm, travel  5.3 mm, pitch 2.54 mm, L 32.3 mm, 2021-D-2.25N-NI-1.3

ICT spring contact with probe, cone, Ø 1.65 mm, travel  5.3 mm, pitch 2.54 mm, L 32.3 mm, 2021-B-2.25N-NI-0.8

ICT spring contact with probe, flathead, Ø 1.65 mm, travel  5.3 mm, pitch 2.54 mm, L 32.3 mm, 2021-F-2.25N-AU-2.0

ICT spring contact with probe, round head, Ø 1.65 mm, travel  5.3 mm, pitch 2.54 mm, L 32.3 mm, 2021-G-2.25N-AU-2.0

ICT spring contact with probe, waffle, Ø 1.65 mm, travel  5.3 mm, pitch 2.54 mm, L 32.3 mm, 2021-C-2.25N-NI-1.8

ICT spring contact with probe, Quadruple-crown, Ø 1.65 mm, travel  5.3 mm, pitch 2.54 mm, L 32.3 mm, 2021-G-2.25N-NI-1.8

ICT spring contact with probe, round head, Ø 1.65 mm, travel  5.3 mm, pitch 2.54 mm, L 32.3 mm, 2021-BST-2.25N-AU-0.8

ICT spring contact with probe, waffle, Ø 1.65 mm, travel  5.3 mm, pitch 2.54 mm, L 32.3 mm, 2021-C-2.25N-AU-1.3

ICT spring contact with probe, triangular, Ø 1.65 mm, travel  5.3 mm, pitch 2.54 mm, L 32.3 mm, 2021-H-2.25N-RH-1.8

ICT spring contact with probe, triangular, Ø 1.65 mm, travel  5.3 mm, pitch 2.54 mm, L 32.3 mm, 2021-H-2.25N-RH-2.0