Sleeve for test probe, soldered connection, H 1060/GRV-L-AU

High current spring contact with probe, flathead, Ø 2.65 mm, travel  5.5 mm, pitch 4 mm, L 27.5 mm, 1060-FX-3.0NE-AU-4.0 C

High current spring contact with probe, flathead, Ø 2.65 mm, travel  5.5 mm, pitch 4 mm, L 27.5 mm, 1060-FX-3.0NE-AU-6.0 C

Sleeve for test probe, soldered connection, H 1060/G-L-AU

High current spring contact with probe, waffle, Ø 2.65 mm, travel  5.5 mm, pitch 4 mm, L 27.5 mm, 1060-CX-3.0NE-AU-3.0 C

High current spring contact with probe, waffle, Ø 2.65 mm, travel  5.5 mm, pitch 4 mm, L 27.5 mm, 1060-CX-3.0NE-AU-4.0 C

High current spring contact with probe, round head, Ø 2.65 mm, travel  5.5 mm, pitch 4 mm, L 27.5 mm, 1060-DX-3.0NE-AU-2.3 C

High current spring contact with probe, round head, Ø 2.65 mm, travel  5.5 mm, pitch 4 mm, L 27.5 mm, 1060-DX-3.0NE-AU-3.0 C