1060/G-CX-3.0NE-AU-3.0 C | PTR

Threaded spring contact with probe, waffle, Ø 2.65 mm, travel  5.5 mm, pitch 4 mm, L 27.5 mm, 1060/G-CX-3.0NE-AU-3.0 C

Order No.: 12H2320
EAN: 4099889469141
MPN:
1060/G-CX-3.0NE-AU-3.0 C
610600671251
Series: 1060/G
PTR
1060/G-CX-3.0NE-AU-3.0 C PTR Contact Probes
Image may differ
Unit Price (€ / pc.)
9.1035 € *
Available: 5 pcs.
Leadtime: 3 Weeks **
Total Price:
9.10 € *
Price list
Quantity
Price per unit*
1 pcs.
9.1035 €
10 pcs.
8.0444 €
100 pcs.
6.9972 €
250 pcs.
6.4617 €
1000 pcs.
5.9500 €
*incl. VAT plus shipping costs
**Subject to prior sale

High-current threaded spring force contacts, type PTR 10.

Design A: concave 90°. For connector pins, wire-wrap posts and straight / bent terminals. To be used on clean PCB because of the risk of contamination. W: pointed tip 30°, for PCB traces, through-plating, solder joints, and test pads. Design BS: practical flexible needle, point-of use reliable penetration of flux and coiling on unwashed PCBs or modules, or for contacting SMD. Design BST: sharp steel needle with endurance for reliable penetration of flux and dirt on uncleaned PCBs or modules and for SMD contacts. Design C: serrated, A universal head for straight or curved hookup wires, wire-wrap posts and connector pins. Design CS: serrated, with overlapping plastic insulation, presence test of component connections. The overlapping plastic insulation prevents electrical contact in places where the connection is missing. Design D: round head, for contacting PCB traces and contact surfaces. The round tip does not leave marks on the contact surface. Also used to contact socket contacts in connectors. Design E: convex, for clean vias or connector sockets. Design F: flat tip, used on tabs and clean convex contact surfaces to avoid damage to the surface. Design G: four-point crown, for hookup wires, solder joints and test pads without heavy contamination. Design H: pyramid, contact to plated through-holes without problems, also suitable for use on objects with flux residue. Design K: hexagonal, similar to H, but more aggressive and with higher contact reliability. Also used with rotary spring force contacts, cuts through oxide layers and dirt. Design M: crown, with overlapping center tip. The crown and central tip combination ensures reliable contact at almost any test point. The overlapping center tip fixes the probe tip. Design Q: 4-point crown, self-cleaning, for contacting on heavily soiled PCBs. The special cut of the tip discharges dirt to the outside.

High-current probes with tip series 1060/G.

Grid: 4.0 mm. Maximum travel: 5.5 mm. Working travel: 4.4 mm. Working travel spring force (±20 %): 3.0 N. Spring prestress: 0.8 N. Rated current: 24 A. Contact resistance: typically 10 mohm. Barrel: gold-plated brass. Spring: gold-plated spring steel.

Technical attributes (type, tip shape, tip diameter, plunger material): 1060/G-CX-3,0 N-Au-3,0C, CX, D 3.0 mm, gold-plated CuBe.

Technical specifications
diameter 2.65 mm
Stroke 5.5 mm
Head shape waffle
Length 27.5 mm
Material brass
Rated current 24 A
Grid 4 mm
Logistics
Country of origin DE
Customs tariff number 85369095
Compliance
RoHS conform Yes
Date of RoHS guidelines 3/31/15
SVHC free Yes