Round spacer sleeve, without thread, M2, aluminum, 005.71.048

Threaded probe, waffle, Ø 4 mm, travel  5 mm, pitch 4 mm, L 28.3 mm, F73306B400G300

Threaded spring contact with probe, round head, Ø 4 mm, travel  5.5 mm, pitch 4 mm, L 28.5 mm, 1060/G-A-1.5N-AU-4.0

Threaded spring contact with probe, waffle, Ø 4 mm, travel  5.5 mm, pitch 4 mm, L 28.5 mm, 1060/G-C-1.5N-AU-4.0

Threaded spring contact with probe, flathead, Ø 4 mm, travel  5.5 mm, pitch 4 mm, L 28.5 mm, 1060/G-F-1.5N-RH-4.0

High current spring contact with probe, waffle, Ø 4 mm, travel  5.5 mm, pitch 4 mm, L 27.5 mm, 1060-CX-3.0NE-AU-4.0 C

High current spring contact with probe, waffle, Ø 4 mm, travel  5.5 mm, pitch 4 mm, L 27.5 mm, 1060/G-CX-3.0NE-AU-4.0 C

Test equipment kit, with banana plug, TL 1

Pin contact, 0.5 mm², AWG 20, crimp connection, 2784210000

Pin contact, 0.5 mm², AWG 20, crimp connection, 2784170000

Receptacle, 0.08-0.2 mm², AWG 28-24, crimp connection, gold-plated, 1682430000

Receptacle, 0.2-0.52 mm², AWG 24-20, crimp connection, gold-plated, 1682450000

Pin contact, 0.08-0.2 mm², AWG 28-24, crimp connection, gold-plated, 1682420000

Pin contact, 0.2-0.52 mm², AWG 24-20, crimp connection, gold-plated, 1682440000

Receptacle, 0.5 mm², AWG 20, crimp connection, silver-plated, 1682330000

Receptacle, 0.75-1 mm², AWG 18, crimp connection, silver-plated, 1682350000

Receptacle, 1.5 mm², AWG 16, crimp connection, silver-plated, 1682370000

Receptacle, 2.5 mm², AWG 14, crimp connection, silver-plated, 1682390000

Receptacle, 4.0 mm², AWG 12, crimp connection, silver-plated, 1682410000

Pin contact, 0.5 mm², AWG 20, crimp connection, silver-plated, 1682320000